A High-Sensitivity Thermal Method for Determining the Presence of Quartz at Levels Below 0.1%
| Autor: | G. S. Sheffield, J. R. Schorr |
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| Rok vydání: | 2008 |
| Předmět: | |
| Zdroj: | 98th Annual Meeting and the Ceramic Manufacturing Council's Workshop and Exposition: Materials & Equipment/Whitewares: Ceramic Engineering and Science Proceedings |
| DOI: | 10.1002/9780470294420.ch38 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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