| Popis: |
This dossier in Comptes rendus Physique is devoted to the most recent technologies and methodologies in electron microscopy available in 2014, which have provided this instrument with unique capabilities for atomic-level investigations in the domain of materials science. The present introduction provides some basic information required for an easier reading of the following manuscripts. It therefore focuses on column design, signal acquisition strategy, aberration correction, resolving power, in situ experiments and novel approaches, illustrated with a description of a few of their present and future fields of use. |
