Comparative Analysis of Different channel Materials of Multiple Gate FET

Autor:	B R Bhavana, Ravi L Bellubbi, Nidhi Sanjay Banavasi, P Vimala, N.R Nithin Kumar
Rok vydání:	2021
Zdroj:	2021 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT).
DOI:	10.1109/conecct52877.2021.9622592
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e4a3003dc30d024f9724d99079b36d05 https://doi.org/10.1109/conecct52877.2021.9622592 Zobrazit plný text záznamu