A Neural Network Approach for Single-Event Latchup Prediction Based on TCAD Simulations in CMOS Technology

Autor:	D. Truyen, E. Leduc, L. Montagner, M. Briet, A. Collange
Rok vydání:	2021
Zdroj:	2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e49073432d7e605e71b0d7d6bbd8dbbc https://doi.org/10.1109/radecs53308.2021.9954493 Zobrazit plný text záznamu