Physical mechanism responsible for degradation of organic light-emitting diodes
| Autor: | JaeMan Kim, Youbong Lim, DooSup Hwang, HoonHee Kim, JungAe Choi, Youngjin Lee, Dongjune Kim, DongHee Yoon, Soohoa Jeong |
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| Rok vydání: | 2014 |
| Předmět: |
Arrhenius equation
Materials science business.industry Astrophysics::High Energy Astrophysical Phenomena Astrophysics::Cosmology and Extragalactic Astrophysics Condensed Matter Physics Luminance Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials symbols.namesake OLED symbols Optoelectronics Degradation (geology) Electrical and Electronic Engineering Exponential decay business Formation rate Astrophysics::Galaxy Astrophysics Diode |
| Zdroj: | Microelectronic Engineering. 129:21-23 |
| ISSN: | 0167-9317 |
| DOI: | 10.1016/j.mee.2014.06.020 |
| Popis: | Degradation of organic light-emitting diodes (OLEDs) is primarily due to the formation of the non-emissive centers, and their formation rate is dependent on the temperature. We observed the linear dependence of total luminance on the temperature, and formulated a novel degradation model to present an analytic function for the OLED degradation with physically meaningful fitting parameters. It was found that the stretched exponential decay (SED) behavior of the degradation is mainly due to the temperature dependence of the luminance. |
| Databáze: | OpenAIRE |
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