Developing Benchmarks for Radiation Testing of Microcontroller Arithmetic Units Using ATPG
| Autor: | Krishna Prasad Gnawali, Spyros Tragoudas, Heather Quinn |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Nuclear and High Energy Physics
010308 nuclear & particles physics Computer science Reliability (computer networking) Automatic test pattern generation 01 natural sciences law.invention Set (abstract data type) Microcontroller Microprocessor Nuclear Energy and Engineering law Test set Logic gate 0103 physical sciences Sensitivity (control systems) Hardware_ARITHMETICANDLOGICSTRUCTURES Electrical and Electronic Engineering Arithmetic |
| Zdroj: | IEEE Transactions on Nuclear Science. 68:857-864 |
| ISSN: | 1558-1578 0018-9499 |
| Popis: | Reliability-focused benchmarks are used to test systems in harsh operating conditions, including space and terrestrial radiation environment. The sensitivity to single-event effects of a microprocessor in a radiation environment depends on the set of input vectors used at the time of testing due to logical masking. This article analyzes the impact of the input test set on the cross section of the microprocessor and proposes a mechanism to derive a high-quality input test set using automatic test pattern generation (ATPG) for radiation testing of microprocessor’s arithmetic and logical units. |
| Databáze: | OpenAIRE |
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