Single-Flange 2-Port TRL Calibration for Accurate THz ${\rm S}$-Parameter Measurements of Waveguide Integrated Circuits

Autor:	Jörgen Stenarson, K. Yhland, Johanna Hanning, Peter Sobis, Jan Stake, Tomas Bryllert
Rok vydání:	2014
Předmět:	Radiation Materials science Terahertz radiation business.industry Acoustics Port (circuit theory) Integrated circuit Flange law.invention Optics law Calibration Scattering parameters Measurement uncertainty Waveguide (acoustics) Electrical and Electronic Engineering business
Zdroj:	IEEE Transactions on Terahertz Science and Technology. 4:582-587
ISSN:	2156-3446 2156-342X
DOI:	10.1109/tthz.2014.2342497
Popis:	This paper describes a single flange 2-port measurement setup for S-parameter characterization of waveguide integrated devices. The setup greatly reduces calibration and measurement uncertainty by eliminating vector network analyzer (VNA) extender cable movement and minimizing the effect of waveguide manufacturing tolerances. Change time of standards is also improved, reducing the influence of VNA drift on the uncertainty. A TRL calibration kit has been manufactured and measurements are demonstrated in WR-03 (220–325 GHz).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e3d780988dbf98a49a6e846526102422 https://doi.org/10.1109/tthz.2014.2342497 Zobrazit plný text záznamu