| Popis: |
γ-Ray diffractometry is a convenient method for studying the degree of perfection of large “as-grown” single crystals without the need of precedent cutting or surface treatments. By means of a double crystal arrangement the angular resolution in γ-ray diffractometry has been improved by at least one order of magnitude to 1 second of arc. The high resolution studies of crystal mosaicity on niobium, vanadium, copper and FeS2 (pyrite) single crystals as well as the measurement of the diffraction pattern of a curvature distorted Si wafer, which are presented in the paper, demonstrate the power of the technique and its enlarged range of application due to the gain in instrumental resolution. |
