Characterization of as-deposited cold sprayed Cr-coating on Optimized ZIRLO™ claddings
| Autor: | Hans-Olof Andrén, Hisham Aboulfadl, Pratik Lokhande, Andrea Fazi, Mohammad Sattari, Krystyna Marta Stiller, Anand Harihara Subramonia Iyer, Mattias Thuvander |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Nuclear and High Energy Physics
Materials science 02 engineering and technology Atom probe Substrate (electronics) engineering.material 021001 nanoscience & nanotechnology Microstructure 01 natural sciences 010305 fluids & plasmas law.invention Nuclear Energy and Engineering Coating law 0103 physical sciences Microscopy Dynamic recrystallization engineering General Materials Science Electron microscope Composite material 0210 nano-technology Layer (electronics) |
| Zdroj: | Journal of Nuclear Materials. 549:152892 |
| ISSN: | 0022-3115 |
| Popis: | As-produced Cr-coated Optimized ZIRLO™ cladding material fabricated with the cold-spray (CS) deposition process is studied. Cross-sectional electron microscopy, nano-hardness profiling, transmission electron microscopy, transmission Kikuchi diffraction, and atom probe tomography (APT) were performed to investigate the nature of the CS Cr-coating/Optimized ZIRLO™ interface, the microstructure of the coating, and the effects of the deposition on the Zr-substrate microstructure. The former surface of the Zr-substrate was found to have a highly deformed nano-crystalline microstructure, the formation of which was attributed to dynamic recrystallization occurring during coating deposition. This microstructural change, evaluated with electron backscattered diffraction and nano-hardness profiling, appeared to be confined to a depth of a few microns. Through APT analysis, a 10–20 nm thick intermixed bonding region was observed at the interface between coating and substrate. The chemical composition of this region suggests that this layer originated from a highly localized shearing and heating of a thin volume of the outermost former surface of the substrate. The study of the intermixed bonding region's crystalline structure was performed with high resolution transmission electron microscopy and revealed a distorted hexagonal close-packed structure. |
| Databáze: | OpenAIRE |
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