| Autor: |
G. Wilhite, S. V. Pabbisetty, L. Hughes, D. Davis, Charles P. Todd, J. Widaski, Kendall S. Wills, P. Scott, O. Diaz de Leon, Jianbai Zhu, R. R. Parker |
| Rok vydání: |
1998 |
| Předmět: |
|
| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| DOI: |
10.31399/asm.cp.istfa1998p0472 |
| Popis: |
The advent of Flip Chip and other complex package configurations and process technologies have made conventional failure analysis techniques inapplicable. This paper covers the ways in which conventional techniques have been modified to meet the FA challenges presented by these new devices – specifically, by forcing analysis to be done from the backside of the device. Modifications to the traditional FA process steps, including new sample preparation methods, changes in hardware, and alterations to physical failure analysis processes are described. To demonstrate the use of backside analytical approaches, some examples of applications and a case study are also included. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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