| Popis: |
This work-in-progress paper discusses challenges with application of Built-In Testing (BIT) in component-based embedded-systems. Testing constitutes a large part of the time and budget in development of embedded software systems. Such systems are often mission-critical, making testing highly important, and at the same time testing embedded systems is challenging because of their limited observability. We investigate the possible application of BIT in components for embedded systems, as a technique to advance the technology and knowledge for analysis and verification of functional correctness, real-time behavior, safety, and reliability of these systems. |
