An x-ray spectral high-voltage meter

Autor: I. P. Zubkov, Yu. V. Larchikov
Rok vydání: 1993
Předmět:
Zdroj: Measurement Techniques. 36:232-234
ISSN: 1573-8906
0543-1972
DOI: 10.1007/bf00977866
Popis: Here are considered test results from a new dc high-voltage meter based on the x-ray spectral method proposed in [i, 2]. This meter, the RIVN, has been certified as a standard means of measurement in a test system for the high-voltage range40-120 kV, and the purpose of the study has been to check the scope for maintaining the basic error within 0.15% limits. The metrological aspects of using this meter have been discussed [3-6]. The proposed method enables one to calibrate the scale from the known energies of ~-ray sources without linkage to the volt standard [6]. The RIVN has the advantage that one can measure and monitor high voltages wihtout direct connection to the current circuits, which is preferable in medical equipment use.
Databáze: OpenAIRE
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