Autor: |
N.А. Tulina, I. Yu. Borisenko, А.М. Ionov, I.М. Shmytko, А.А. Ivanov, А.N. Rossolenko |
Rok vydání: |
2014 |
Předmět: |
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Zdroj: |
Materials Letters. 136:404-406 |
ISSN: |
0167-577X |
DOI: |
10.1016/j.matlet.2014.08.086 |
Popis: |
We address bipolar resistive switching effects in structures based on oxides of transition metals which are promising for applications in modern memory devices. Mesoscopic niobium oxide film heterostrucures have been produced. The current–voltage characteristics of the heterostructures based on amorphous films of anodized niobium oxide show a diode character with a weak BRS effect that is more pronounced in structures based on crystalline niobium oxide films. Analysis of the conductivity mechanisms in the heterostructures obtained suggests that the diode behavior and the existence of bistable resistance states are related to modulation of a Schottky barrier formed by a niobium oxide layer with a variable resistance in the metal–oxide interface. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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