Comparison of light rare earths N4,5-level soft X-ray and auger electron appearance-potential spectra
| Autor: | D.R. Chopra, T.K. Hatwar |
|---|---|
| Rok vydání: | 1985 |
| Předmět: |
Auger electron spectroscopy
Radiation Chemistry Binding energy Bremsstrahlung X-ray fluorescence Condensed Matter Physics Atomic and Molecular Physics and Optics Spectral line Secondary electrons Electronic Optical and Magnetic Materials Secondary emission Physical and Theoretical Chemistry Atomic physics Spectroscopy |
| Zdroj: | Journal of Electron Spectroscopy and Related Phenomena. 36:319-329 |
| ISSN: | 0368-2048 |
| DOI: | 10.1016/0368-2048(85)80029-3 |
| Popis: | Appearance-potential Spectroscopy (APS) probes the binding energy of core levels and local conduction band states of atoms in the surface region. Soft X-ray APS (SXAPS) and Auger electron APS (AEAPS), respectively, measure the differential X-ray fluorescence and secondary electron yields as a function of incident electron energy. We have obtained the N 4,5 -level SXAPS and AEAPS spectra of La, Ce, Pr, Nd and Sm metals. Both spectra exhibit multiplet structure below the expected 4 d excitation threshold and a broad, 10–20 eV wide peak above the threshold followed by small peaks of decreasing intensity. The data are used to gain an understanding of the decay mechanism following the excitation of the core levels in these spectroscopies. The strong similarity observed between the SXAPS and AEAPS indicates that the characteristic emission and not the bremsstrahlung dominates the spectral lineshape in APS. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|