SWIR HgCdTe 256x256 focal plane array technology at BAE Systems

Autor: J.D. Mullarkey, S. P. Tobin, Allen W. Hairston, Mark A. Hutchins, Peter W. Norton, Marion B. Reine, Mark N. Gurnee, John Marciniec
Rok vydání: 2006
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.693201
Popis: This paper reports new performance data for SWIR HgCdTe 256x256 hybrid Focal Plane Arrays with cutoff wavelengths of 2.6-2.7 μm, operating at temperatures of 190 K to 220 K. The unit cell size is 30x30 μm 2 . Back-illuminated SWIR HgCdTe P-on-n photodiode arrays were fabricated from two-layer LPE films grown on CdZnTe substrates. Response uniformity is excellent, with σ/μ=3-4%, and response operabilities are better than 99.9%. At a temperature of 190 K and a background photon flux of 6.8x10 11 ph/cm 2 -s, the median NEI is 1.1x10 9 ph/cm 2 -s, which is 1.4 times the BLIP NEI. NEI operabilities are better than 98.8%. Quantum efficiencies for large-area test diodes are 69% to 78%, close to the 79% upper limit imposed by reflection from the non-antireflection-coated CdZnTe substrate.
Databáze: OpenAIRE