Testing system for radiation effects of CCD and CMOS image sensors

Autor:	玛丽娅 Ma Li-ya, 李豫东 Li Yu-dong, 郭旗 Guo Qi, 任建伟 Ren Jian-wei, 汪波 Wang Bo
Rok vydání:	2013
Předmět:	Engineering CMOS business.industry Electrical engineering Electronic engineering Radiation Image sensor business Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials
Zdroj:	Optics and Precision Engineering. 21:2778-2784
ISSN:	1004-924X
DOI:	10.3788/ope.20132111.2778
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e22f871619635c20b7d5cba4854117e7 https://doi.org/10.3788/ope.20132111.2778 Zobrazit plný text záznamu