Kinetic Study of Electromigration in Al and Al Alloy Thin Films by Combined Resistance and Temperature Change Measurements
| Autor: | R. W. Vook, A. J. Patrinos, C. Y. Chang, J. A. Schwarz, K. Sato |
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| Rok vydání: | 1991 |
| Předmět: |
Renewable Energy
Sustainability and the Environment Chemistry Metallurgy Alloy chemistry.chemical_element engineering.material Condensed Matter Physics Kinetic energy Electromigration Surfaces Coatings and Films Electronic Optical and Magnetic Materials Aluminium Materials Chemistry Electrochemistry engineering Thin film |
| Zdroj: | Journal of The Electrochemical Society. 138:2774-2778 |
| ISSN: | 1945-7111 0013-4651 |
| DOI: | 10.1149/1.2086053 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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