Analysis of Stress-Testing Using Raman Spectra on Heteroepitaxy Si/GaN

Autor:	薛晨阳 Xue Chenyang, 王勇 Wang Yong, 唐建军 Tang Jianjun, 梁庭 Liang Ting, 张文栋 Zhang Wendong, 熊继军 Xiong Jijun
Rok vydání:	2010
Předmět:	symbols.namesake Materials science business.industry symbols Optoelectronics Electrical and Electronic Engineering business Raman spectroscopy Stress testing (software) Atomic and Molecular Physics and Optics
Zdroj:	Laser & Optoelectronics Progress. 47:083002
ISSN:	1006-4125
DOI:	10.3788/lop47.083002
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e21bafdebf8455074af45b3cf47159a1 https://doi.org/10.3788/lop47.083002 Zobrazit plný text záznamu