Surface dependent behaviour of CdS LO-phonon mode
Autor: | R. Trejo-Vazquez, J. R. Molina-Contreras, F. J. Villalobos-Piña, G Romo-Luevano, Sergio Calixto, Claudio Frausto-Reyes, C. Medina-Gutiérrez |
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Rok vydání: | 2007 |
Předmět: |
Acoustics and Ultrasonics
Phonon Chemistry business.industry Surface finish Condensed Matter Physics Molecular physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Root mean square Wavelength symbols.namesake Optics Microscopy Surface roughness symbols business Raman spectroscopy Intensity (heat transfer) |
Zdroj: | Journal of Physics D: Applied Physics. 40:4922-4927 |
ISSN: | 1361-6463 0022-3727 |
DOI: | 10.1088/0022-3727/40/16/025 |
Popis: | In this paper, we develop a sensitive optical method to monitor the surface roughness in the investigation of surfaces. By applying this method to measure the RMS surface roughness of various surfaces, we found RMS values which are comparable to those obtained by atomic force microscopy measurements. In addition, we present a simple empirical model to calculate the RMS surface roughness which shows very good agreement with the surface roughness measurements taken by the method reported in this paper. Finally, the application of our method to the study of the LO-phonon mode of CdS suggests that its intensity is dominated by the surface roughness. This roughness dependent behaviour of the CdS LO-phonon mode is experimentally confirmed by using an excitation wavelength near its E0 transition. |
Databáze: | OpenAIRE |
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