Total Jitter Measurement for Testing HSIO Integrated SoCs

Autor:	M. Ishida, T.J. Yamaguchi
Rok vydání:	2008
Předmět:	Production testing Computer science business.industry Embedded system Hardware_INTEGRATEDCIRCUITS Bit error rate System on a chip Instrumentation (computer programming) business Jitter Test solution
Zdroj:	ATS
DOI:	10.1109/ats.2008.38
Popis:	Total jitter measurement has been ready to perform jitter testing of HSIO integrated SoCs in an HV production testing environment. Since it requires no special loadboard nor additional hardware or instrumentation, it provides a cost-effective total jitter test solution for HV production testing.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e201cce0e1a3f9c2b76b0cec031a6491 https://doi.org/10.1109/ats.2008.38 Zobrazit plný text záznamu