Investigation of GaAs—InyGa1−yPzAs1−z–InxGa1−x-As grading heterojunctions formation
Autor: | Yu. B. Bolkhovityanov, R. I. Bolkhovityanova, V. I. Yudaev |
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Rok vydání: | 1980 |
Předmět: | |
Zdroj: | Kristall und Technik. 15:387-394 |
ISSN: | 1521-4079 0023-4753 |
DOI: | 10.1002/crat.19800150403 |
Popis: | The initial stages of growth of GaAs–InGaAsPvar–InxGa1−xAs heterostructures (x = 0.1 and 0.17) were investigated for the equilibrium-cooling method of LPE growth. Similar investigations were carried out for GaAs–InGaAsPvar–In0.05Ga0.95As heterocompositions, but for the step-cooling technique. The scheme of growing of In0.17Ga0.83As films of GaAs substrates with several intermediate buffler InGaAsPvar layers is represented. These heterostructures were shown to have less than 106 cm−2 dislocation density on the overall area of the film (> 2 cm2). [Russian Text Ignored.] |
Databáze: | OpenAIRE |
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