Identifying the elastoplastic properties of ductile film on hard substrate by nanoindentation
| Autor: | Shengwang Yu, Yucheng Wu, Xuefeng Shu, Gesheng Xiao, Wang Yongsheng, Xuegang Xing |
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| Rok vydání: | 2021 |
| Předmět: |
010302 applied physics
Reverse analysis Materials science 02 engineering and technology Substrate (printing) Nanoindentation Strain hardening exponent 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Surfaces Coatings and Films Indentation 0103 physical sciences Thin film Composite material 0210 nano-technology Instrumentation Elastic modulus Hard substrate |
| Zdroj: | Vacuum. 189:110252 |
| ISSN: | 0042-207X |
| Popis: | Nanoindentation analysis was proposed on a ductile film/hard substrate system to extract the elastoplastic properties of thin film. Based on the dimensional analysis method (DAM), relationships between the indentation responses and film/substrate elastoplastic properties were established. Reverse analysis algorithms were proposed by introducing the substrate effects, which could provide sufficient information at different indentation depths to solve the dimensional equations. Numerical and instrumental indentations were carried out on a titanium film/alumina ceramic substrate system to verify the proposed reverse method, by which the elastic modulus, yield stress and work hardening exponent of the film were successfully obtained. |
| Databáze: | OpenAIRE |
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