| Autor: |
Aaron Lewis, Artium Khatchatouriants, Anna Radko, Noel Axelrod, Millet Treinin, Nissim Ben-Yosef |
| Rok vydání: |
2000 |
| Předmět: |
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| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| Popis: |
We demonstrate that near-field optical and atomic force microscopy data can be used for super-resolution 3D image restoration in optical sectioning fluorescence microscopy. A crucial feature in this approach is the full integration of such data sets with digital far-field images. The scanned probe data is used to provide modalities for boundary constraints which define surface optical information and spatial domains of optical alterations in a sample with a spatial precision that has been unachievable in the past. A restoration algorithm that can use such a complex of data for 3D image deconvolution is presented. It uses a Tikhonov- Miller regularization scheme and allows for the imposition of different types of constraints to obtain super-resolution deconvolved images. Performance was tested by using simulated 3D imaging. An example is given of the restoration of a 3D wide field optical image of a biological specimen in the presence of atomic force constraints.© (2000) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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