Electron spectroscopy for chemical analysis studies on electron beam evaporated CuOx thin films

Autor: D.P. Gandhi, S.C. Sabharwal, Mukul Gupta, K.P. Muthe, J.C. Vyas, Kulwant Singh, V.K Handu, G.P. Kothiyal
Rok vydání: 1994
Předmět:
Zdroj: Thin Solid Films. 249:140-143
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)90751-x
Popis: Electron spectroscopy for chemical analysis studies were carried out on CuOx films deposited onto yttria-stabilized zirconia single-crystal substrates by electron-beam evaporation under molecular beam epitaxy conditions. The measurements were taken without exposing the films to the atmosphere. The results show that copper oxide dissociates under electron-beam heating in high vacuum and the reassociation of copper and oxygen to form suboxide (CuOx) at the substrate is a function of its temperature. The maximum oxygen content was found to be about 46% of the starting source material at the growth temperature of 500 °C, above which the CuOx film starts to decompose.
Databáze: OpenAIRE