IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware

Autor:	Peiyu Liu, Shouling Ji, Xuhong Zhang, Qinming Dai, Kangjie Lu, Lirong Fu, Wenzhi Chen, Peng Cheng, Wenhai Wang, Raheem Beyah
Rok vydání:	2021
Zdroj:	2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE).
DOI:	10.1109/ase51524.2021.9678785
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e106aa73dcfabcc63b9cbb0f15c28d9c https://doi.org/10.1109/ase51524.2021.9678785 Zobrazit plný text záznamu