P-90: Quantitative Analysis of Electrical Mura in LCDs

Autor:	Tsau-Hua Hsieh, Chi-Chieh Hsu, Chao-Yi Hung, Yueh-Ping Chang
Rok vydání:	2008
Předmět:	Physics Mura Optics Noise (signal processing) business.industry Evaluation methods Computer vision Artificial intelligence business Luminance
Zdroj:	SID Symposium Digest of Technical Papers. 39:1521
ISSN:	0097-966X
DOI:	10.1889/1.3069447
Popis:	In this work, we have investigated the evaluation method to quantify the phenomenon of Mura. The undulation of luminance and transmittance distribution is precisely matched to the Mura position. And by adjusting Vgh, we can distinguish the specific Mura that results from electrical variation. Additionally, transferring T% to Vdisp, Mura degree can be quantified without the noise of the test condition and traced the source clearly. Furthermore, we make criterion of dVdisp as 18mV at L16 to prevent the phenomenon of Mura.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e0fe5f0620840ad82cc6fe5facc4f3b0 https://doi.org/10.1889/1.3069447 Zobrazit plný text záznamu Plný text