Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge–Response pair acquisition using Built-In Self-Test before shipping
| Autor: | Yohei Hori, Hanpei Koike, Tomoki Iizuka, Hiromitsu Awano, Makoto Ikeda, Yasuhiro Ogasahara, Toshihiro Katashita |
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| Rok vydání: | 2020 |
| Předmět: |
Silicon
Computer science 020208 electrical & electronic engineering chemistry.chemical_element Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology Signal 020202 computer hardware & architecture Challenge response pair ComputingMilieux_MANAGEMENTOFCOMPUTINGANDINFORMATIONSYSTEMS Built-in self-test chemistry Hardware and Architecture Hardware_INTEGRATEDCIRCUITS 0202 electrical engineering electronic engineering information engineering Electronic engineering Electrical and Electronic Engineering Software Linear feedback shift register Degradation (telecommunications) Voltage |
| Zdroj: | Integration. 71:144-153 |
| ISSN: | 0167-9260 |
| DOI: | 10.1016/j.vlsi.2019.12.002 |
| Popis: | We implemented pseudo-linear feedback shift-register-based physical unclonable functions (PL-PUFs) on silicon and analyzed their performances in terms of reproducibility, uniqueness, and resistance to machine-learning attacks. A PL-PUF is compact and high-throughput PUF, slightly oversensitive to voltage fluctuations. To overcome this drawback, we developed a capturing signal generation circuit that was tolerant to the reproducibility degradation caused by supply voltage changes. We also implemented a Built-In Self-Test (BIST) circuit with an irreversible destruction mechanism to enable exceedingly fast challenge–response pairs (CPRs) for the PUFs before shipping. After the CPRs were evaluated, the BIST circuit became invulnerable to exploitation by attackers. |
| Databáze: | OpenAIRE |
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