Highly Sensitive Image Inspection for Line Defect Using Projection Data Analysis

Autor:	Norio Nomura, Minoru Higashihara, Naoaki Komiya, Masashi Yasuda, Masayuki Tejima, Naoki Chiba, Hideto Fujita
Rok vydání:	2000
Předmět:	Computer science business.industry Computer graphics (images) Computer vision Image Inspection Artificial intelligence Electrical and Electronic Engineering Line (text file) Projection (set theory) business Highly sensitive
Zdroj:	IEEJ Transactions on Electronics, Information and Systems. 120:144-150
ISSN:	1348-8155 0385-4221
DOI:	10.1541/ieejeiss1987.120.1_144
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e076842b51789ad437cf1cba1af67c02 https://doi.org/10.1541/ieejeiss1987.120.1_144 Zobrazit plný text záznamu