Nanoprofiles of TiO2 films deposited by PLD using an evanescent light method
| Autor: | Ion N. Mihailescu, G. Dorcioman, N. Mirchin, Angela Popescu, Liviu Duta, Aaron Peled, J. Azoulay |
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| Rok vydání: | 2014 |
| Předmět: |
Materials science
Scattering business.industry Mechanical Engineering Substrate (electronics) Geotechnical Engineering and Engineering Geology law.invention Pulsed laser deposition Light intensity Optics Optical microscope Mechanics of Materials law Electrical and Electronic Engineering Thin film business Penetration depth Layer (electronics) Civil and Structural Engineering |
| Zdroj: | World Journal of Engineering. 11:111-116 |
| ISSN: | 1708-5284 |
| Popis: | TiO2 thin films were deposited by Pulsed Laser Deposition (PLD) on glass substrates at 27°C and 100°C. The extraction efficiency of evanescent light from the deposited nanolayers and their thickness profiles in the range of (1-100) nm was evaluated using the Differential Evanescent Light Intensity (DELI) imaging method. This optical microscopy technique is based on capturing the evanescent light emitted by the material layer deposited on the substrate. The results were analyzed and discussed in terms of the effective penetration depth parameter. The effective scattering cross-section of the TiO2 nanometer particles was estimated. |
| Databáze: | OpenAIRE |
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