Effect of basal‐plane stacking faults on the Bragg peak broadening in m‐plane GaN

Autor:	David W. Weyburne, Alvin Drehman, Qing Paduano
Rok vydání:	2011
Předmět:	Diffraction Materials science Condensed matter physics business.industry Plane (geometry) Stacking Bragg peak Condensed Matter Physics Coherence length Tilt (optics) Optics X-ray crystallography Twist business
Zdroj:	physica status solidi c. 8:2251-2254
ISSN:	1610-1642 1862-6351
DOI:	10.1002/pssc.201001140
Popis:	The effect of basal-plane stacking faults on the Bragg peak broadening in m-plane GaN is studied using X-ray diffraction ω-scans and ω/2θ-scans. The analysis considers the coexistence of multiple broadening contributions including tilt, twist, limited coherence length, and micro-strain. Although the effects of basal-plane stacking faults are detectable in the different configurations used in this study, we show that the ω-scans in the asymmetric geometry are better suited for quantifying basal-plane stacking fault-related broadening, since the broadening due to twist does not affect the ω-scan profiles in such diffraction geometries (© 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
Databáze:	OpenAIRE
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