IEEE Std 1581 — A standardized test access methodology for memory devices

Autor:	Heiko Ehrenberg, Bob Russell
Rok vydání:	2011
Předmět:	Engineering Logic synthesis business.industry Embedded system Logic gate System level Standardized test business Frequency modulation IEEE floating point Test (assessment)
Zdroj:	ITC
DOI:	10.1109/test.2011.6139141
Popis:	Memory devices have been becoming more complex with every generation and this trend is very likely to continue. Different kinds of memories present different challenges for board level test applications. In this paper we discuss several of those challenges and will introduce a new test technology standardized as IEEE Std 1581, offering an elegant solution to many problems related to the test of the board and system level connectivity at memory device pins.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dfd058078cc91deaa0ceb9b82c86747c https://doi.org/10.1109/test.2011.6139141 Zobrazit plný text záznamu