Observation of Dislocation Behavior in Graphite by Using Ultrasonic Atomic Force Microscopy(NDE3)

Autor:	Toshihiro Tsuji, Kazushi Yamanaka, Hiroshi Irihama
Rok vydání:	2001
Předmět:	Kelvin probe force microscope Materials science Atomic force microscopy Atomic force acoustic microscopy Ultrasonic sensor Nanotechnology General Medicine Conductive atomic force microscopy Graphite Composite material Dislocation Non-contact atomic force microscopy
Zdroj:	Proceedings of the Asian Pacific Conference on Fracture and Strength and International Conference on Advanced Technology in Experimental Mechanics. :232-235
ISSN:	2433-1279
DOI:	10.1299/jsmeatemapcfs.1.01.203.0_232
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dfc10d615f3484d63fd9e98226aa4ea7 https://doi.org/10.1299/jsmeatemapcfs.1.01.203.0_232 Zobrazit plný text záznamu