Fracture of nanoscale copper films on elastomer substrates

Autor:	Marcel Utz, Matthew R. Begley, Orion Scott, Hilary Bart-Smith
Rok vydání:	2009
Předmět:	Materials science Physics and Astronomy (miscellaneous) Tension (physics) Micromechanics chemistry.chemical_element Elastomer Copper law.invention Optical microscope chemistry law Fracture (geology) Composite material Nanoscopic scale Necking
Zdroj:	Applied Physics Letters. 95:231914
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.3268458
Popis:	This letter describes the evolution of crack spacing in copper films (bonded to elastomer substrates) as a function of applied strain. Tension tests were conducted on cast poly(dimethylsiloxane) substrates coated with sputtered copper films with 200–600 nm thickness. Optical microscopy was used to measure the spacings between parallel cracks (normal to the tension direction) at various levels of applied strain in the range of 0.01%–10%. The measured relationships between applied strain and crack spacing are predicted by micromechanical models of behavior between cracks; the experiments indicate Gc∼400–600 J/m2 with an implied defect spacing of ∼100–600 μm. These values are consistent with the theoretical work that is dissipated during necking instabilities during plastic deformation.
Databáze:	OpenAIRE
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