Autor: |
W. Rachmady, Phan Anh, G. Dewey, P. Nguyen, Matthew V. Metz, Tung I-Cheng, Patrick Morrow, Rajat Kanti Paul, Scott B. Clendenning, Nicole K. Thomas, A. A. Oni, Ryan Keech, Marko Radosavljevic, Huang Cheng-Ying, Alaan Urusa, Manan Mehta, Kang Jun Sung, A. Lilak, Mannebach Ehren, Hui Jae Yoo, Bob Turkot, Kabir Nafees, S. Vishwanath, K. L. Cheong, Richard E. Schenker, B. Krist, Michael K. Harper, Jack Portland Kavalieros |
Rok vydání: |
2020 |
Předmět: |
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Zdroj: |
2020 IEEE International Electron Devices Meeting (IEDM). |
Popis: |
We demonstrate 3-D self-aligned stacked NMOS-on-PMOS multiple Si nanoribbon transistors with successful integration of vertically stacked dual source/drain EPI process and vertically stacked dual metal gate process. Both top NMOS and bottom PMOS show high on-state performance and superior short channel control. A functional CMOS inverter is also demonstrated with well-balanced voltage transfer characteristics. The 3-D self-aligned stacked CMOS nanoribbon transistor is demonstrated as a promising transistor architecture to continue Moore’s law scaling. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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