Depth profiling of the degradation of OC1OC10-PPV monitored by positron beam analysis
| Autor: | A Alba Garcı́a, L. D. A. Siebbeles, A. van Veen, H. Schut |
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| Rok vydání: | 2003 |
| Předmět: |
chemistry.chemical_classification
Materials science Excimer laser business.industry Mechanical Engineering medicine.medical_treatment Metals and Alloys Polymer Condensed Matter Physics Electronic Optical and Magnetic Materials symbols.namesake Optics Positron chemistry Mechanics of Materials Annihilation radiation Materials Chemistry symbols medicine Thin film business Spectroscopy Doppler effect Doppler broadening |
| Zdroj: | Synthetic Metals. 138:43-47 |
| ISSN: | 0379-6779 |
| DOI: | 10.1016/s0379-6779(02)01263-8 |
| Popis: | The Doppler broadening of annihilation radiation (DBAR) technique and UV-Vis photo-absorption spectroscopy were used to monitor the photo-oxidation of thin films (200 nm) of OC1OC10-PPV. Samples were exposed in air to a 308 nm excimer laser and a commercial UV-Vis lamp. By means of the DBAR technique, the degradation was monitored as a function of depth when illuminating from the polymer side or the substrate side. It showed that the degradation is more pronounced on the side where the light affects, indicating that the photo-oxidation is not limited by oxygen diffusion. DBAR results were compared to photo-absorption measurements showing that in the first stages of the photo-oxidation positrons were more sensitive to changes in the polymer film. The non-destructive character of the DBAR technique and the possibility to perform depth profiling makes it a promising technique to study multi-layer devices. |
| Databáze: | OpenAIRE |
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