Single-Event Effects Induced by Heavy Ions in SONOS Charge Trapping Memory Arrays

Autor:	A. Alec Talin, T. Patrick Xiao, Christopher H. Bennett, Helmut Puchner, David Russell Hughart, Matthew J. Marinella, Hugh J. Barnaby, Sapan Agarwal
Rok vydání:	2022
Předmět:	Physics Nuclear and High Energy Physics Nuclear Energy and Engineering Event (relativity) Charge (physics) Trapping Electrical and Electronic Engineering Atomic physics Ion
Zdroj:	IEEE Transactions on Nuclear Science. 69:406-413
ISSN:	1558-1578 0018-9499
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::df0bbe38da3aba23bb7da8458f31883a https://doi.org/10.1109/tns.2021.3127549 Zobrazit plný text záznamu