Is Deep Learning Good Enough for Software Defect Prediction?

Autor:	Arya Haldar, Sushant Kumar Pandey, Anil Kumar Tripathi
Rok vydání:	2022
Předmět:	History Polymers and Plastics Business and International Management Industrial and Manufacturing Engineering
Zdroj:	SSRN Electronic Journal.
ISSN:	1556-5068
DOI:	10.2139/ssrn.4089137
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::deec750774b1dc3c871ee2760d19a95e https://doi.org/10.2139/ssrn.4089137 Zobrazit plný text záznamu