Low-frequency noise in RF-sputtered Pb-doped 2223 phase BiSrCaCuO thin films
Autor: | B. Tremblay, C. X. Qiu, W. W. Lam, L. Ngo Phong, A. L. Li, Ishiang Shih |
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Rok vydání: | 1994 |
Předmět: | |
Zdroj: | Canadian Journal of Physics. 72:270-273 |
ISSN: | 1208-6045 0008-4204 |
DOI: | 10.1139/p94-040 |
Popis: | Noise measurements were carried out on RF-sputtered Pb-doped 2223 phase BiSrCaCuO superconducting thin films. No definite relationship between noise and bias current was observed in the superconducting state, however, a square-current dependence of noise was found in the normal state. The magnitude of the noise in the BiSrCaCuO films at room temperature was one to five orders of magnitude larger than that in a normal metal. Near the tail of the resistance transition, noise peaks were observed that were 3–12 K below the maximum of the derivative resistance–temperature curve. Noise dependence on frequency shows an approximate 1/f relation in both normal and superconducting states. The origin of the noise in the normal state is believed to be due to thermal fluctuation or resistance fluctuation and the larger noise near zero TC is possibly caused by grain boundaries in the films. |
Databáze: | OpenAIRE |
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