Reliability theory for multistate systems with multistate components
| Autor: | Kailash C. Kapur, Joseph C. Hudson |
|---|---|
| Rok vydání: | 1982 |
| Předmět: |
Reliability theory
Computer science Complex system Binary number Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Reliability engineering Range (mathematics) Simple (abstract algebra) In real life State (computer science) Electrical and Electronic Engineering Safety Risk Reliability and Quality Reliability (statistics) |
| Zdroj: | Microelectronics Reliability. 22:1-7 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/0026-2714(82)90045-2 |
| Popis: | An important problem in reliability theory is to determine the reliability of a complex system given the reliabilities of its components. In real life the system and its components are capable of being in a whole range of states, varying from a perfect functioning state to states related to various levels of performance degradation to complete failure. Thus, the binary models are an oversimplification of the actual reality. This paper presents models and their applications in terms of reliability analysis to situations where the system can have whole range of states and all its components can also have whole range of multiple states. The system generally has various levels of operational performance and hence the total system effectiveness measures should reflect all of these performance levels and their reliabilities. The methodology presented is illustrated by a simple example. |
| Databáze: | OpenAIRE |
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