Texture and microstructure imaging in six dimensions with high-energy synchrotron radiation
Autor: | Hans Joachim Bunge, L. Wcislak, J. R. Schneider, Helmut Klein, Ulf Garbe |
---|---|
Rok vydání: | 2003 |
Předmět: |
010302 applied physics
Physics Orientation (computer vision) business.industry Bragg's law Synchrotron radiation DESY 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences General Biochemistry Genetics and Molecular Biology Optics Beamline 0103 physical sciences Crystallite Texture (crystalline) 0210 nano-technology business Interpolation |
Zdroj: | Journal of Applied Crystallography. 36:1240-1255 |
ISSN: | 0021-8898 |
Popis: | The texture of a material can be calculated from several pole figures, which, in turn, are usually measured by one of several `step-scan' techniques. In these techniques, the finite step width limits the attainable orientation resolving power. In the present paper, the discontinuous step-scan technique is replaced by a continuous `sweeping' technique based on the continuous movement of an area detector during exposure. In this way, continuous two-dimensional `images' of pole figures are obtained, without the necessity of interpolation. Similar sweeping techniques are also being used to obtain continuous images of other sections and projections of the six-dimensional `orientation–location' space which characterizes a polycrystalline structure completely. The high potential orientation and/or location resolving power of these imaging techniques can only be reached with synchrotron radiation. In the present paper, the measurements were made at the high-energy (short-wavelength) beamline BW5 at HASYLAB/DESY in Hamburg. The high orientation and location resolving power implies the necessity to distinguish `grain-resolved' textures and microstructures (mainly in recrystallized materials) from `continuous' ones (mainly in deformed materials). Under certain conditions, it is thus possible to obtain the complete six-dimensional `orientation stereology' of grain-resolved microstructures. The new methods are illustrated with several examples, including technological applications. |
Databáze: | OpenAIRE |
Externí odkaz: |