An Abnormal Photoluminescence Enhancement in (Eu, Yb) Co-doped SiO2Thin Film
| Autor: | C. L. Heng, J. T. Li, Z. Han, P. G. Yin |
|---|---|
| Rok vydání: | 2014 |
| Předmět: |
Ytterbium
Materials science Photoluminescence Annealing (metallurgy) Analytical chemistry Oxide Mineralogy chemistry.chemical_element Condensed Matter Physics Electronic Optical and Magnetic Materials chemistry.chemical_compound chemistry X-ray photoelectron spectroscopy Control and Systems Engineering Transmission electron microscopy Materials Chemistry Ceramics and Composites Electrical and Electronic Engineering Thin film Europium |
| Zdroj: | Integrated Ferroelectrics. 151:179-186 |
| ISSN: | 1607-8489 1058-4587 |
| DOI: | 10.1080/10584587.2014.901125 |
| Popis: | We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si2O7. |
| Databáze: | OpenAIRE |
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