Solid state features of electrocrystallized tungstate films

Autor:	N. A. Rudina, M. I. Borzenko, Lyudmila M. Plyasova, Galina A. Tsirlina, Oleg A. Petrii, G. N. Kustova, I. Yu. Molina
Rok vydání:	2005
Předmět:	Diffraction Materials science Scanning electron microscope Solid-state Tungsten oxide Crystal structure Condensed Matter Physics Electrochemistry chemistry.chemical_compound Crystallography Tungstate chemistry General Materials Science Electrical and Electronic Engineering Spectroscopy
Zdroj:	Journal of Solid State Electrochemistry. 9:371-379
ISSN:	1433-0768 1432-8488
Popis:	X-ray diffraction, scanning electron microscopy, and infra-red spectroscopy are applied to study the evolution of films electrodeposited from acidic tungstate solutions. Structural inhomogeneity is found to be responsible for the difference in rechargeability of films of different thickness. Voltammetric responses demonstrate pronounced sensitivity to the nature of crystalline phases, thus throwing light on the defects of the lattice features of nonstoichiometric W(V)–W(VI) oxides. One crystalline phase observed in the films under study and attributed to the layered nonstoichiometric oxohydroxide was never reported for oxotungstate films fabricated by other techniques. This phase is believed to be special to electrocrystallized films and to keep some structural features of dissolved isopolytungstate molecular precursors.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dde5f341631db75096411ae28682aedb https://doi.org/10.1007/s10008-004-0642-6 Zobrazit plný text záznamu Full text from SpringerLink