Characterization of application-specific probes for SPMs
| Autor: | Michael D. Kirk, Marco Tortonese |
|---|---|
| Rok vydání: | 1997 |
| Předmět: |
Force constant
Cantilever Physics::Instrumentation and Detectors Atomic force microscopy Chemistry Acoustics Computer Science::Other Scanning probe microscopy Classical mechanics Error analysis Deflection (engineering) Physics::Atomic and Molecular Clusters Application specific Non-contact atomic force microscopy |
| Zdroj: | SPIE Proceedings. |
| ISSN: | 0277-786X |
| DOI: | 10.1117/12.271229 |
| Popis: | This paper addresses the problem of determining the absolute force constant of Atomic Force Microscope cantilevers. In the method presented, the cantilever under test is deflected against a reference cantilever of known spring constant. The relative deflection of the two cantilevers is related to their spring constants. The novelty of our approach is in the use of a micromachined reference cantilever of a precisely controlled force constant. Preliminary results show that our method is capable of measuring the force constant of cantilevers in the range of 0.1 to 10 N/m with an accuracy of better than 20%. The error is dominated by the non-linear effects in the force versus distance curves used for the measurement. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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