Characterization of Cu−Rh/SiO2 by temperature-programmed desorption (TPD) of hydrogen

Autor: Yee Soong, Steven S. C. Chuang, Richard P. Noceti, R.R. Schehl
Rok vydání: 1992
Předmět:
Zdroj: Reaction Kinetics & Catalysis Letters. 48:31-36
ISSN: 1588-2837
0133-1736
DOI: 10.1007/bf02070063
Popis: The presence of Cu on Rh/SiO2 inhibited H2 chemisorption at 303 K and suppressed CO hydrogenation. TPD study shows that chemisorption of H2 on Cu−Rh/SiO2 is an activated process at 303 K.
Databáze: OpenAIRE