Indentification of the 6H-SiC(0001) 3×3 surface reconstruction core-level shifted components
| Autor: | F. Amy, C. Brylinski, Yeukuang Hwu, Patrick Soukiassian |
|---|---|
| Rok vydání: | 2000 |
| Předmět: |
Surface (mathematics)
Materials science Silicon Photoemission spectroscopy Attenuation Analytical chemistry chemistry.chemical_element Synchrotron radiation Surfaces and Interfaces Condensed Matter Physics Molecular physics Surfaces Coatings and Films chemistry.chemical_compound chemistry X-ray photoelectron spectroscopy Materials Chemistry Silicon carbide Surface reconstruction |
| Zdroj: | Surface Science. 464:L691-L696 |
| ISSN: | 0039-6028 |
| Popis: | We investigate the 6H-SiC(0001) 3×3 surface reconstruction by Si 2p and C 1s core-level photoemission spectroscopy using synchrotron radiation providing the first identification of surface core-level shifted components. Specific spectral features at the Si 2p core level, including bulk (B) and two surface shifted (SS1 and SS2) components, show a surface reconstruction structure involving several silicon atomic planes. In comparison, the C 1s core level shows no involvement of carbon atoms in the 6H-SiC(0001) 3×3 surface reconstruction structure. These results, obtained by an attenuation layer model, indicate that SS1 is related to the Si adatom and that SS2 is related to the Si adlayer+trimer of the 6H-SiC(0001) 3×3 surface reconstruction. |
| Databáze: | OpenAIRE |
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