A novel approach for 3D morphological characterization of silica nanoparticle population through HAADF-STEM
| Autor: | Christophe Tromas, F. Pailloux, Alexandra Delvallée, Laurent Devoille, Nicolas Feltin, Loïc Crouzier |
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| Rok vydání: | 2021 |
| Předmět: |
education.field_of_study
Materials science business.industry Applied Mathematics 020208 electrical & electronic engineering 010401 analytical chemistry Population 02 engineering and technology Condensed Matter Physics 01 natural sciences Dark field microscopy Signal 0104 chemical sciences Characterization (materials science) Nanomaterials Optics Transmission electron microscopy Scanning transmission electron microscopy 0202 electrical engineering electronic engineering information engineering Particle Electrical and Electronic Engineering education business Instrumentation |
| Zdroj: | Measurement. 180:109521 |
| ISSN: | 0263-2241 |
| DOI: | 10.1016/j.measurement.2021.109521 |
| Popis: | The morphology of amorphous silica NPs in three dimensions (3D) of space is analysed using a single technique: the transmission electron microscope in Scanning Transmission Electron Microscopy with High Angle Annular Dark Field (HAADF-STEM) imaging mode. For this purpose, a method consisting in adjusting the HAADF-STEM signal by a function describing the thickness of material in a sphere has been developed to determine the height of the nano-object and tested on particles having quasi-spherical shape. This approach is suitable only in the case of a nanomaterial chemically homogeneous. A reference present in the image is required for calibrating the signal strength. This reference can be either a particle of known shape or a particle whose height was previously measured with another technique (i.e. Atomic Force Microscopy). Thus, the study of the small silica particles by HAADF-STEM highlighted their spheroidal shape but also their preferential orientation on the substrate. |
| Databáze: | OpenAIRE |
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