Power cycling test of power semiconductor based on junction temperature monitoring

Autor:	Kwanhun Lee, Sung Soon Choi, Wooyoung Lee, Byungjin Ma
Rok vydání:	2014
Předmět:	Reliability (semiconductor) Materials science Semiconductor business.industry Power module Power cycling Electrical engineering Junction temperature business Power (physics)
Zdroj:	20th International Workshop on Thermal Investigations of ICs and Systems.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dd4dc1ad0ba815b4235267c423ad4382 https://doi.org/10.1109/therminic.2014.6972505 Zobrazit plný text záznamu