62‐2: Highly Reliable Shift Register with Coplanar a‐IGZO TFTs by Splitting Top Gate into Dual Gates

Autor:	Yuanfeng Chen, Suhui Lee, Jin Jang, Duk Young Jeong, Ji Seob Lee
Rok vydání:	2019
Předmět:	Materials science law business.industry Optoelectronics business Shift register Active matrix law.invention Dual (category theory)
Zdroj:	SID Symposium Digest of Technical Papers. 50:878-881
ISSN:	2168-0159 0097-966X
DOI:	10.1002/sdtp.13062
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dd3d502784e386d5f625ee4237ddafa1 https://doi.org/10.1002/sdtp.13062 Zobrazit plný text záznamu Plný text