A New Method of Estimating the Process Capability Index with Exponential Distribution Using Interval Estimate of the Parameter
| Autor: | Sai Sarada Vedururu, M. Subbarayudu, K. V. S. Sarma |
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| Rok vydání: | 2019 |
| Předmět: |
Statistics and Probability
Exponential distribution Applied Mathematics Interval estimation Value (computer science) 01 natural sciences Confidence interval Combinatorics 010104 statistics & probability 03 medical and health sciences 0302 clinical medicine Distribution (mathematics) Skewness ComputingMethodologies_DOCUMENTANDTEXTPROCESSING 030221 ophthalmology & optometry Process capability index Discrete Mathematics and Combinatorics 0101 mathematics Statistics Probability and Uncertainty Safety Risk Reliability and Quality Squared deviations Mathematics |
| Zdroj: | Stochastics and Quality Control. 34:95-102 |
| ISSN: | 2367-2404 2367-2390 |
| DOI: | 10.1515/eqc-2019-0005 |
| Popis: | This paper deals with a new method of deriving the Process Capability Index (PCI) when the quality characteristic X follows a positively skewed distribution. The focus of the paper is to derive a new estimate of PCI by taking into account the {100(1-{\alpha})} Confidence Intervals (CI) of the parameter (s) and arriving at a new expression. The formula {{C}_{{s}}} , proposed by Wright (1995) which contains a component for skewness, is reexamined and a new estimate is constructed by utilizing the lower, middle and upper values of the CI of the parameter. The weighted average of the three possible estimates of {{C}_{{s}}} is proposed as the new estimate by taking the weights inversely proportional to the squared deviation from the hypothetical value of {{C}_{{s}}} . The properties of the estimate are studied by simulation using one parameter exponential distribution. |
| Databáze: | OpenAIRE |
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