Topological insulator interfaced with ferromagnetic insulators: Bi2Te3 thin films on magnetite and iron garnets

Autor: Mengxin Guo, S. G. Altendorf, Sheng-Chieh Liao, Alexander C. Komarek, C. N. Wu, V. M. Pereira, Chien-Te Chen, Chang Liu, J. Kwo, Hong-Ji Lin, Minghwei Hong, Liu Hao Tjeng
Rok vydání: 2020
Předmět:
Zdroj: Physical Review Materials. 4
ISSN: 2475-9953
DOI: 10.1103/physrevmaterials.4.064202
Popis: We report our study about the growth and characterization of $\mathrm{B}{\mathrm{i}}_{2}\mathrm{T}{\mathrm{e}}_{3}$ thin films on top of ${\mathrm{Y}}_{3}\mathrm{F}{\mathrm{e}}_{5}{\mathrm{O}}_{12}$(111), $\mathrm{T}{\mathrm{m}}_{3}\mathrm{F}{\mathrm{e}}_{5}{\mathrm{O}}_{12}$(111), $\mathrm{F}{\mathrm{e}}_{3}{\mathrm{O}}_{4}$(111), and $\mathrm{F}{\mathrm{e}}_{3}{\mathrm{O}}_{4}$(100) single-crystal substrates. Using molecular-beam epitaxy, we were able to prepare the topological insulator/ferromagnetic insulator heterostructures with no or minimal chemical reaction at the interface. We observed the anomalous Hall effect on these heterostructures and also a suppression of the weak antilocalization in the magnetoresistance, indicating a topological surface-state gap opening induced by the magnetic proximity effect. However, we did not observe any obvious x-ray magnetic circular dichroism (XMCD) on the Te ${M}_{45}$ edges. The results suggest that the ferromagnetism induced by the magnetic proximity effect via van der Waals bonding in $\mathrm{B}{\mathrm{i}}_{2}\mathrm{T}{\mathrm{e}}_{3}$ is too weak to be detected by XMCD, but still can be observed by electrical transport measurements. This is in fact not inconsistent with reported density-functional calculations on the size of the gap opening.
Databáze: OpenAIRE